Key benefits
• Shorten and simplify debug flow by easily tracking down the root cause of any difference
• Improve quality and reduce customer returns by eliminating test-pattern mismatches
• Enable fine-grained inspection when tests fail on ATE, even without ATE knowhow
• Have the flexibility of using multiple ATEs, ensuring tests of different systems are identical
Key features
• Compare patterns of various conversion types: ATE to ATE, EDA to ATE, and EDA to EDA
• Supported EDA formats:VCD, eVCD, WGL, STIL
• Supported ATE formats: V93K, Teradyne IG-XL J750, Flex, UltraFlex, T2000, ETS800
• Can be customized to compare only certain sections or signals