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The proven fastest conversion tool on the market combines powerful innovation with ease of use and GUI, leading to faster high-quality test development
Creates an ATE-aware test bench, allowing pre-silicon testing with same results as post-silicon ATE, making production test debug shorter and more predictable
Compares test vectors of different EDA and ATE formats at waveform level for improved quality and debug flow, tracking down the root cause of any difference
Simplifies DUT setup maintenance saving valuable resources by producing optimized test patterns at runtime with no need to simulate and translate them
CONTACT US
CONTACT US
Fax: +972 3 6122128
POB 1893 Ramat Gan 52118 Israel
