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Converting design vectors into ATE programs
The proven fastest conversion tool on the market combines powerful innovation with ease of use and GUI, leading to faster high-quality test development
Pre-silicon test program validation
Creates an ATE-aware test bench, allowing pre-silicon testing with same results as post-silicon ATE, making production test debug shorter and more predictable
Cross-format test comparison
Compares test vectors of different EDA and ATE formats at waveform level for improved quality and debug flow, tracking down the root cause of any difference
Device-Aware ATE-Independent Test Dev
Simplifies DUT setup maintenance saving valuable resources by producing optimized test patterns at runtime with no need to simulate and translate them
