ATE Test Program Software Tools

ATE Test Program
Software Tools

Empowering Test, Product and DFT Engineers With Innovative Tools for
Creating Ultimate Test Programs

Empowering Test, Product and DFT Engineers With Innovative Tools for Creating Ultimate Test Programs

Your Test Program at Its Best

Breakthrough EDA-ATE
Closed-Loop Technology

Accelerate Test Program Bring Up, Reduce
Test Cost and Minimize Post-Silicon Debug

Up to 200x Faster ATE Software Tools

Getting You Faster to a High-Quality
Test Program

Your Trusted ATE Software Partner

Trusted by Hundreds of Semiconductor
Companies Worldwide Since 1999

Breakthrough EDA-ATE
Closed-Loop Technology

Accelerate Test Program Bring Up, Reduce
Test Cost and Minimize Post-Silicon Debug

Up to 200x Faster ATE
Software Tools

Getting You Faster to a High-Quality
Test Program

Your Trusted ATE
Software Partner

Trusted by Hundreds of Semiconductor
Companies Worldwide Since 1999

Learn How To Accelerate Your ATE Test Program Bring Up and Debug

Tools Built for Test Engineering From the Ground Up

TestInsight’s design-to-test tools are the industry standard for test vector translation, validation, optimization and visualization. They are used by hundreds of semiconductor companies, from the largest chipmakers to stealth-mode startups.

Test Pattern Conversion

TDL™

Test Pattern Conversion

The proven fastest conversion tool on the market, translating STIL, WGL and e/VCD into V93K, T2000, J750, u/Flex, Eagle, NI, Cohu and more.

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Digital Test Program Validation

Virtual Tester™

Digital Test Program Validation

A Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.

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Mixed-Signal Test Program & DIB Validation

AMS-VT™

Mixed-Signal Test Program Validation

A Mixed-Signal Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.

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Cross-Format Test Comparison

TestDiff™

Cross-Format Test Comparison

Compares test vectors of different EDA and ATE formats for improved quality and debug flow, tracking down the root cause of any difference.

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Runtime ATE Pattern Generation

PatGen™

Runtime ATE Pattern Generation

Generates optimized test patterns at runtime with no need to simulate and translate them, supporting incremental test update to save ATE time.

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Verify, Edit & View ATE Vectors

Test Vector Studio™

Verify, Edit & View ATE Vectors

An intuitive GUI packing a wealth of vector analysis and optimization tools―waver, tester rule check, vector edit, compression and parallelization.

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Choose the Right Tool for Your Test Program

The TestInsight tools support all popular Automatic Test Equipment and semiconductor IC tester platforms by Advantest, Teradyne, Cohu, NI and more, such as 93K / V93000, T2K / T2000, ATP, J750, J750ex, Flex, UltraFlex, Eagle, ets364, ets800, IG-XL and DiamondX. Use the table below to find the right tool for your specific project.

Test Program Creation

Test Program Validation

TDL™
Test Pattern Conversion

PatGen™
Runtime ATE Pattern Generation

Test Vector Studio™
Verify, Edit & View ATE Vectors

Virtual Tester™
Digital Test Program Validation

AMS Virtual Tester™
Mixed-Signal Test Program Validation

TestDiff™
Cross-Format Test Comparison

Reduce
Time to Market

Faster pattern conversion

Faster pattern conversion
with up to 200x faster translation

Faster test dev

Faster test dev
leveraging advanced ATE features such
as Multiple Clock Domains, Xmodes etc.

Faster ATE execution

Faster ATE execution
using incremental test update

Faster test dev

Faster test dev
eliminating DUT-setup
simulation and translation

Less duplicated work

Less duplicated work
using a shared database

Faster ATE execution

Faster ATE execution
using test vector optimization

Less post-si debug

Less post-si debug
using Tester Rule Checker

Faster test dev

Faster test dev
using an intuitive GUI

Less post-si debug

Less post-si debug
using pre-si test program validation

Faster post-si debug

Faster post-si debug
using EDA tools instead
of just ATE

Earlier load board debug

Pre-si load board debug
reduces post-si load board issues

Less post-si debug

Less post-si debug
using pre-si validation of mixed-signal test programs

Faster post-si debug

Faster post-si debug
using EDA tools instead
of just ATE

Faster debug

Faster debug
detecting mismatches between identical patterns of different formats

Reduce
Costs

Fewer man-hours
Fewer man-hours
 Using tester compliance validation
 Leveraging advanced ATE features:
 Multiple Clock Domains, Xmodes etc.
Less ATE time

Less ATE time
using incremental test update

Fewer man-hours

Fewer man-hours
by eliminating pattern maintenance
and duplicated work using
a shared database

Greater ATE selection

Greater ATE selection
thanks to an ATE-independent
database

Less ATE time

Less ATE time
using test vector optimization

Fewer man-hours

Fewer man-hours
by using an intuitive GUI
and programmable test
editing

Greater ATE selection

Greater ATE selection
using test vector
manipulation

Fewer man-hours

Fewer man-hours
thanks to faster post-si
debug using EDA tools
instead of just ATE

Fewer man-hours

Fewer man-hours
thanks to faster post-si
debug using EDA tools
instead of just ATE

Fewer man-hours

Fewer man-hours
thanks to faster debug,
detecting mismatches
between identical patterns
of different formats

Greater ATE selection

Greater ATE selection
verifying that tests of
different systems are
identical

Improve
Quality

ATE readiness

ATE readiness
using tester compliance
validation

Better ATE patterns

Better ATE patterns
thanks to ultimate
conversion accuracy

Better ATE patterns

Better ATE patterns
eliminating error-prone
duplicated work and
pattern maintenance

ATE readiness

ATE readiness
using Tester Rule Checker

Better ATE patterns

Better ATE patterns
thanks to an improved
workflow using an
intuitive GUI

ATE readiness

ATE readiness
using closed-loop test
program validation

ATE readiness

ATE readiness
using closed-loop test
program validation

Better ATE patterns

Better ATE patterns
verifying that tests of
different formats are
identical

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