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Tester Data Link (VCD2STIL + ATEGen) :
Combine powerful, sophisticated tools with ease of use
Full GUI support
Proven fastest conversion tool in the market
Cleans e/VCD waveforms before timing extraction and cyclization
Handling data with multiple clocks
Aligns edges as specified by user
Clock based sampling and cyclization
Conditional value assignment of signal values based on other signals
Pre-Silicon Debug
VT simulates the ATE <-> DUT interaction using a simulation test bench created directly from the ATE Test program
The VT test bench compares DUT respond to ATE vector data and high lights mismatches
Revealing Design/Test issues before first Si and shortening test program debug cycle and time to production
The tool internally translates any format to an event stream. It then compares the two tests and highlights any differences.
The actual signal behavior is compared and identified.
The view shows the differences in the waver, but allows any diff to be tracked down to the source syntax. Thus the user can see the cause and location of each test data difference.
The user can customize the tool activity and make it only compare certain sections or certain signals
