 
															Accelerate Test Program Bring Up, Reduce 
Test Cost and Minimize Post-Silicon Debug
Getting You Faster to a High-Quality 
Test Program
Trusted by Hundreds of Semiconductor 
Companies Worldwide Since 1999
 
															Accelerate Test Program Bring Up, Reduce 
Test Cost and Minimize Post-Silicon Debug
 
															Getting You Faster to a High-Quality 
Test Program
 
															Trusted by Hundreds of Semiconductor 
Companies Worldwide Since 1999
Learn How To Accelerate Your ATE Test Program Bring Up and Debug
TestInsight’s design-to-test tools are the industry standard for test vector translation, validation, optimization and visualization. They are used by hundreds of semiconductor companies, from the largest chipmakers to stealth-mode startups.

The proven fastest conversion tool on the market, translating STIL, WGL and e/VCD into V93K, T2000, J750, u/Flex, Eagle, NI, Cohu and more.

A Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.

A Mixed-Signal Virtual ATE that enables early pre-silicon failure detection, making production test debug shorter and more predictable while improving quality.

Compares test vectors of different EDA and ATE formats for improved quality and debug flow, tracking down the root cause of any difference.

Generates optimized test patterns at runtime with no need to simulate and translate them, supporting incremental test update to save ATE time.

An intuitive GUI packing a wealth of vector analysis and optimization tools―waver, tester rule check, vector edit, compression and parallelization.
The TestInsight tools support all popular Automatic Test Equipment and semiconductor IC tester platforms by Advantest, Teradyne, Cohu, NI and more, such as 93K / V93000, T2K / T2000, ATP, J750, J750ex, Flex, UltraFlex, Eagle, ets364, ets800, IG-XL and DiamondX. Use the table below to find the right tool for your specific project.
Test Program Creation
Test Program Validation
Reduce
Time to Market
Faster pattern conversion
with up to 200x faster translation
Faster test dev
leveraging advanced ATE features such
as Multiple Clock Domains, Xmodes etc.
Faster ATE execution 
using incremental test update
Faster test dev 
eliminating DUT-setup 
simulation and translation
Less duplicated work 
using a shared database
Faster ATE execution 
using test vector optimization
Less post-si debug 
using Tester Rule Checker
Faster test dev 
using an intuitive GUI
Less post-si debug 
using pre-si test program validation
Faster post-si debug 
using EDA tools instead 
of just ATE
Pre-si load board debug 
reduces post-si load board issues
Less post-si debug 
using pre-si validation of mixed-signal test programs
Faster post-si debug 
using EDA tools instead 
of just ATE
Faster debug 
detecting mismatches between identical patterns of different formats
Reduce 
Costs
Less ATE time 
using incremental test update
Fewer man-hours 
by eliminating pattern maintenance 
and duplicated work using 
a shared database
Greater ATE selection 
thanks to an ATE-independent 
database
Less ATE time 
using test vector optimization
Fewer man-hours 
by using an intuitive GUI 
and programmable test 
editing
Greater ATE selection 
using test vector 
manipulation
Fewer man-hours 
thanks to faster post-si 
debug using EDA tools 
instead of just ATE
Fewer man-hours 
thanks to faster post-si 
debug using EDA tools 
instead of just ATE
Fewer man-hours 
thanks to faster debug, 
detecting mismatches 
between identical patterns 
of different formats
Greater ATE selection 
verifying that tests of 
different systems are 
identical
Improve 
Quality
ATE readiness 
using tester compliance 
validation
Better ATE patterns 
thanks to ultimate 
conversion accuracy
Better ATE patterns 
eliminating error-prone 
duplicated work and 
pattern maintenance
ATE readiness 
using Tester Rule Checker
Better ATE patterns 
thanks to an improved 
workflow using an 
intuitive GUI
ATE readiness 
using closed-loop test 
program validation
ATE readiness 
using closed-loop test 
program validation
Better ATE patterns 
verifying that tests of 
different formats are 
identical
 
															 
											 
											 
											 
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