PatGentm
Runtime ATE Pattern Generation

Reduce Test Cost by up to 40%, Accelerate Test
Development and Improve Test Program Quality

From DUT Setups Straight To ATE Patterns.
No Simulation. No Translation.

From DUT Setups Straight To ATE Patterns. No Simulation. No Translation.

Accelerate and Simplify Test Development, Handling Thousands of DUT Setups Without the Hustle

Accelerate and Simplify Test Dev, Handling Thousands of DUT Setups Without the Hustle

Each production test has a specific device setup, which could differ in just a few register bits from another setup. This is how we end up with thousands of setups leading to thousands of patterns, which are time-consuming to maintain and simulate.

To solve this, PatGen reads the device setup database and generates optimized test patterns at runtime with no need to simulate and translate them.

Before

After

Before

After

Device-Aware Test Update and Per-Die Calibration

Reduce Costly ATE Time and Memory Footprint by up To 40%

Each pattern requires programming of device registers, which can be almost identical to one another with only minor differences. Still, the Automatic Test Equipment (ATE) wastefully reloads each pattern from scratch.

To solve this, PatGen updates only the delta between patterns, saving costly ATE time.

Before

After

A Single ATE-independent Database Shared by Design, Test, and Silicon Validation

Enable Flexible ATE Selection and Create High-Quality Test Programs Faster With Fewer Resources

PatGen allows design, test, and silicon validation teams to share an ATE-independent database as a single source of truth. This prevents error-prone duplicated work, leading to faster development using fewer resources. It also allows flexible ATE selection, as PatGen can output multiple ATE formats.

Transaction-Level Test Creation, Update, and Debug

PatGen makes debug faster and more intuitive thanks to a higher level of abstraction, providing transaction-level test creation, update, and debug instead of bit-level ones.

Key Features and Benefits

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Early Test Program Validation Using a Virtual ATE

Accelerating ATE Pattern Bring Up and Debug

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