Accelerate and Simplify Test Development, Handling Thousands of DUT Setups Without the Hustle
Accelerate and Simplify Test Dev, Handling Thousands of DUT Setups Without the Hustle
Each production test has a specific device setup, which could differ in just a few register bits from another setup. This is how we end up with thousands of setups leading to thousands of patterns, which are time-consuming to maintain and simulate.
To solve this, PatGen reads the device setup database and generates optimized test patterns at runtime with no need to simulate and translate them.
Each pattern requires programming of device registers, which can be almost identical to one another with only minor differences. Still, the Automatic Test Equipment (ATE) wastefully reloads each pattern from scratch.
To solve this, PatGen updates only the delta between patterns, saving costly ATE time.
Enable Flexible ATE Selection and Create High-Quality Test Programs Faster With Fewer Resources
PatGen allows design, test, and silicon validation teams to share an ATE-independent database as a single source of truth. This prevents error-prone duplicated work, leading to faster development using fewer resources. It also allows flexible ATE selection, as PatGen can output multiple ATE formats.
Transaction-Level Test Creation, Update, and Debug
PatGen makes debug faster and more intuitive thanks to a higher level of abstraction, providing transaction-level test creation, update, and debug instead of bit-level ones.