TDLtm
Test Pattern Conversion

Accelerate Test Program Bring Up and Debug
With up to 200X Faster EDA-to-ATE Conversion

Accelerate Test Program Bring Up and Debug With up to 200X Faster EDA-to-ATE Conversion

Convert Design Vectors Into ATE Programs

Translation, Compression, Validation and Visualization of All Popular Test Formats.

TDL is the industry standard tool for accurate test vector translation, compression, validation and visualization. You can use it to convert your DFT patterns, functional simulation or Scan ATPG, to ATE patterns. It converts formats such as STIL, WGL and e/VCD into V93K, T2000, ATP, J750, UltraFlex, ETS364, NI, Cohu and more.

Getting You Faster to a High-Quality Test Program

Up to 200x Faster Design-to-Test Conversion With a Built-In ATE Compliance Checker

TDL provides up to 200x faster test vector conversion, making it the world’s fastest tool of its kind. Its built-in compliance checker ensures your test vectors are ATE-compliant, saving valuable debug time.

Innovation You Can See

Advanced Features in an Easy-to-Use GUI.

Innovation is at the core of everything we do and TDL is no exception. It packs a wealth of features in an intuitive GUI, all of which have been designed in close collaboration with the leading ATE vendors. This allows you to leverage the most advanced IC tester features, such as Multiple Clock Domains and Xmodes.

Closed-Loop Pattern Validation

Pre-Silicon Test Program Validation using a Virtual ATE

TDL converts test patterns into an ATE format. These converted patterns can be easily validated long before first silicon by reading them back into Virtual Tester™ (VT), TestInsight’s Virtual ATE, and creating an ATE-aware Verilog model.

Key Features and Benefits

Supports all common EDA and ATE formats and features

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Early Test Program Validation Using a Virtual ATE

Accelerating ATE Pattern Bring Up and Debug

Early Test Program Validation
Using a Virtual ATE

Accelerating ATE Pattern
Bring Up and Debug

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