TDL is the industry standard tool for accurate test vector translation, compression, validation and visualization. You can use it to convert your DFT patterns, functional simulation or Scan ATPG, to ATE patterns. It converts formats such as STIL, WGL and e/VCD into V93K, T2000, ATP, J750, UltraFlex, ETS364, NI, Cohu and more.
TDL provides up to 200x faster test vector conversion, making it the world’s fastest tool of its kind. Its built-in compliance checker ensures your test vectors are ATE-compliant, saving valuable debug time.
Innovation is at the core of everything we do and TDL is no exception. It packs a wealth of features in an intuitive GUI, all of which have been designed in close collaboration with the leading ATE vendors. This allows you to leverage the most advanced IC tester features, such as Multiple Clock Domains and Xmodes.
TDL converts test patterns into an ATE format. These converted patterns can be easily validated long before first silicon by reading them back into Virtual Tester™ (VT), TestInsight’s Virtual ATE, and creating an ATE-aware Verilog model.