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TDL Design2Test Conversion

Converting design vectors into ATE programs
The proven fastest conversion tool on the market combines powerful innovation with ease of use and GUI, leading to faster high-quality test development

Virtual Tester (VT)

Pre-silicon test program validation
Creates an ATE-aware test bench, allowing pre-silicon testing with same results as post-silicon ATE, making production test debug shorter and more predictable

TestDiff

Cross-format test comparison
Compares test vectors of different EDA and ATE formats at waveform level for improved quality and debug flow, tracking down the root cause of any difference

PatGen

Device-Aware ATE-Independent Test Dev
Simplifies DUT setup maintenance saving valuable resources by producing optimized test patterns at runtime with no need to simulate and translate them