Accelerating ATE Pattern
Bring Up and Debug
Learn how to save pre-silicon time waste and prevent nasty post-silicon surprises
Download the whitepaper
What's in the whitepaper
- Introduction – preventing time waste and nasty surprises
- Accelerating pre-silicon ATE pattern bring up
- Handling slow pattern conversion
- Verifying ATE-compliance of test patterns
- Avoiding unnecessary manual work
- Preventing maintenance and repeated simulations of multiple device setups
- Accelerating post-silicon ATE pattern debug
- Quick root cause analysis using a Virtual ATE
- Compare failing ATE patterns with their source EDA format
- Prevent Failures in the First Place – Debug Before Silicon
- Introducing specific tools that can be used to achieve such acceleration
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