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TestInsight's Virtual Tester (VT) Closing the Gap Between Design & Test

ATE Test Dev - The Bumpy Road from the Lab to the FAB

Design engineers are a world apart from test engineers, and this open loop makes test issues snoball into customer return, longer TTM, higher cost, and lower yield. Also, ATE fallures that are hard to debug often lead to a time-consuming blamestorming, wasting valuable resources.

Why Wait for Silicon to Find Out?

Are those ATE failures caused by design test issues, pattern conversion issues, or manufacturing issues? While common testing methods often have to wait for tapeout, our new paradigm can answer such questions even before first silicon, shortening time to market.

A Tool That Functions Just Like a Real ATE

Such a tool lets designers validate their test programs even witout ATE knowhow. It allows pre-silicon debug and closes the gap between design and test long before silicon is available.

Earlier Failure Detection
Thanks to a Closed-Loop Paradigm




Virtual Tester Creates a Pre-Validated ATE-Aware Test Bench

VT converts test program files into an ATE-aware Verilog model that emulates how ATE drives the DUT. This allows pre-silicon testing on EDA tools with same results as post-silicon ATE, making production shorter and more predictable. VT ensures that tests are ATE-compatible, indentifies pattern conversion issues, and allows focusing only on Silicon upon ATE failures.

 

Innovation for accurate conversions - Testinsight raises the level of testing to meet that of the design, resulting in a highly accurate and effient process and outcome. Enhacnces features and direct-to-binary pattern creation save valuable time and reduce the rist of costly errors.

Proven preformance - TestInsight's TDL has successfully delivered a trenfold preformance increases over aleternative solutions.

Commitment to excellence - A trusted partner of major ATE vendors and semiconductor companies, TDL is backed by Test Insight's reowned customer support.