The table shows the different possible reasons for tests failures on tester
Pre-silicon debug helps clear the artificial fail reasons and focus on real silicon vs device model differences causing such failures.
|Reasons for failures on tester||Virtual tester solution|
|Tester incompatible tests (Design issue)||Acts as tester thus reveals tester incompatibilities|
|Problematic conversion from simulation to ATE (Test Engineering)||Highlights bad conversion issues as test fails in simulation|
|Simulation Model and real Silicon mismatch (Production issues)||Focus only on Model – Silicon mismatch|