Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester.

  • TDL/WGL/STIL to tester conversion
  • Supports STIL ext 0,1,2 constructs
  • Easy to use and cost effective conversion solution
  • Optimize tester resources usage
  • Supports advanced tester features (Such as Xmode, Multi-port etc’)
  • Compress and minimize vectors count
  • Allow direct tester binary patterns creation
  • High Performance
    • Fast run time
    • Handles very large files >6Gb