Press release


Teradyne and Test Insight Partner To Shorten IC Design Cycle Times

Now Offering New Direct EDA To Pattern Solutions

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, Inc. (NYSE:TER) and Test Insight announce the release of new pattern conversion solutions for UltraFLEX to reduce design to test cycle times and expedite Silicon debug and characterization.


The new solutions include the ability to compile hundreds of patterns in parallel using Linux-based Load Share Facilities (LSF) as well as the ability to produce binary IG-XL pattern files directly from electronic design automation (EDA) output formats.


Read the entire PR  here  , For the compiler movie - Click hereCompiler Movie



EDA Industries & Test Insight collaborate to release full Test creation flow for EDA platforms.

Test Insight, a world leader in software tools for linking design to test and managing

ATE programs, announced today that EDA Industries , has adopted ATEGen to

Translating STIL/WGL into EDA Industries tester format.

ATEGen provides Direct conversion from cycle driven simulation data (ATPG scan

patterns) (WGL/TDL/STIL) to tester.


 “Fast and efficient conversions of patterns allows a smooth test creation flow and

saves EDA customers engineering time and conversion turn-around time,”

according to Emiliano Polpetta , System Business Unit Manager.


Read the entire PR here



DELTA optimises test program development with new software

Test Insight's "Tester Data Link"


DELTA optimises test development with new software

DELTA has adopted "Tester Data Link" to improve design to test flows while at the same time offering improved services to customers.


Tester Data Link provides the advanced features and performance needed to convert the large vector sets used to test the complex integrated circuits DELTA designs and tests for customers.  


“DELTA’s customers benefit in two ways – fast and efficient conversions of large vector sets saves engineering time and conversion turn-around time,” according to Thomas Fjord Madsen, DELTA’s Test Development Manager.


He continues, “Plus, with Tester Data Link taking advantage of the advanced features available in DELTA’s modern ATE systems customer’s test costs are kept to a minimum”.


Read the entire PR here