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| Press Releases |
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| 2009 - New SmarTest Data Link - Integrated, standardized, and automated solution to rapidly create test programs for the V93000 |
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October 24, 2006 - Verigy and Test Insight collaborate to accelerate test program development for the Verigy V93000 SOC Tester
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| June 7, 2006 - New STIL environment from Test Insight - STIL-Link toolbox. Easy access to STIL data with new toolbox of solutions |
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| March 7, 2006 Test Insight Addresses Improved Design-for-Test Flow with Cadence |
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| March 2, 2006 - Teradyne Integrates EDA Conversion Tools with FLEX Platform's IG-XL Software; Provides Free 90-Day Trial License for Test Insight Software Suite |
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| January 12, 2006 - STILlink . New STIL API, now fully covers STIL extension 1 and 0 |
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| January 12, 2006 - Virtual Test Wizard . Again proven for dramatically reducing debug time on the tester |
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| Teradyne Expands Support for STIL Format, Strengthening Design-to-Test Linkage |
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| Teradyne Partners with Test Insight to Enable Advanced ATE Test Development Solutions |
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| HDL-Link: a new product to debug a test program in Verilog environment |
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| SCAN-Converter: a new product to Translate WGL Scan vectors into a test program |
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| Test Insight Releases version 2.1 of Wave Wizard Test Program Generation Software |
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| Test Insight Joins The Synopsys In-Sync Program |
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| Test Insight Releases version 2.0 of Wave Wizard Test Program Generation Software |